作者: Daisuke Iida , Motoaki Iwaya , Satoshi Kamiyama , Hiroshi Amano , Isamu Akasaki
DOI: 10.1016/J.JCRYSGRO.2009.01.036
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摘要: Abstract The selective regrowth of GaN during sidewall-seeded epitaxial lateral overgrowth was performed. In addition to adjusting the V/III ratio, control offset angle sidewall found be effective for realizing one-sidewall-seeded a -plane (1 1 2¯ 0) on r (1 1¯ 0 2) sapphire. number coalescence regions grooves reduced, and threading-dislocation stacking-fault densities as low 10 6 –10 7 cm −2 3 4 −1 , respectively, were successfully realized.