Automotive IC reliability: Elements of the battle towards zero defects

作者: Fred G. Kuper

DOI: 10.1016/J.MICROREL.2008.06.026

关键词:

摘要: The battle towards zero defects consists of fast response to PPM signals, prevention incidents and continuous improvement. In this paper elements all three branches are treated. A analysis tool called quality crawl charts is introduced that enables prediction customer complaint levels based on an early set warranty call rate data. fact the automotive industry very cautious with process product changes can be better understood a given practical example small change (in eyes automotive) big consequences. Finally it shown reduction activities also have effect number EOS/ESD returns, category fails form shared responsibility for both supplier customer.

参考文章(3)
Roxana A. Ion, Valia T. Petkova, Bas H. J. Peeters, Peter C. Sander, Field Reliability Prediction in Consumer Electronics Using Warranty Data Quality and Reliability Engineering International. ,vol. 23, pp. 401- 414 ,(2007) , 10.1002/QRE.809
Liquan Fang, Mohammed Lemnawar, Yizi Xing, Cost Effective Outliers Screening with Moving Limits and Correlation Testing for Analogue ICs international test conference. pp. 1- 10 ,(2006) , 10.1109/TEST.2006.297691