Defect-oriented testing of mixed-signal ICs: some industrial experience
作者： Y. Xing
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摘要: Some of Philips' industrial experience are presented in this paper on defect-oriented testing mixed-signal ICs. Case studies analog circuit blocks two automotive ICs described. This is done to demonstrate the potential approach test development for coverage improvement with simple tests. It has been shown that, addition conventional function-oriented tests, bridging faults can be significantly improved by some tests derived using approach.
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