作者: Shen-Hung Wei , Chien-Cheng Lin
DOI: 10.1557/JMR.2014.65
关键词:
摘要: The 8 mol% yttria-stabilized zirconia (8Y-ZrO2) was bonded to stainless steel 316L at 900 °C for 1 h in a protective Ar atmosphere using an interlayer of Ti/Ni/Ti. Interfacial microstructures were characterized both secondary electron microscope (SEM) and transmission (TEM), each with attached energy dispersive spectroscope (EDS). A layer sequence r-phase/TiFe2/TiFe b-Ti/Ti2Fe observed the 316L/Ti interface, whereas Ti2Ni/Ti2Ni TiNi/TiNi3 found Ti/Ni interface. Furthermore, TiO c-ZrO2� x formed Ti/8Y-ZrO2 An acicular a-Ti fine x-phase existed along b-Ti residual Ti foil adjacent 316L, but Ti2Ni within other 8Y-ZrO2. orientation relationships � ½� == 111 ðÞ 0001 , respectively. microstructural development elucidated aid Fe–Ti Ni–Ti binary phase diagrams.