Optical characterization of electrochemically grown anodic oxide on Hg0.85Zn0.15Te
作者： O Castaing , R Granger , J T Benhlal , D Lemoine , O Verdy
DOI: 10.1088/0268-1242/10/7/014
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摘要: Electrochemically grown anodic oxides on Hg0.85Zn0.15Te are characterized by spectroscopic ellipsometry. The use of a simple model dielectric function gives the best extraction parameters defining response with three onsets electronic transitions. At least two molecular compounds constitute oxide; their relative ratio varies monotonically layer thickness. One constituents is more soluble in anodization solution than other. Comparison these results those obtained oxide HgCdTe and consideration Zn-Hg-Te-O phase diagram leads us to propose ZnTeO3 HgTeO3 as major HgZnTe.
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