Analyzing Timing Variations
作者： Mehdi Dehbashi , Görschwin Fey
DOI: 10.1007/978-3-319-09309-3_6
关键词:
摘要: Variability is recognized to be a major challenge in analyzing the circuits as IC technology continues scale down. In this case, delay deviations are imposed by process variations such uncertainty parameters of fabricated devices and interconnects, environmental temperature voltage [BCSS08, APP10, SGT+08].
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