Electronic circuit device able to diagnose status-holding circuits by scanning

作者: Miyuki Ishida , Isao Azuma , Naozumi Aoki

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摘要: An electronic circuit device able to diagnose a status-holding by scanning, the comprising first plurality of integrated circuits each including serial scan for receiving data, generating an address value target as parallel data from received and selecting having generated value, second value. Address information being used information, information.

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Jeffrey D. Bellay, Martin D. Daniels, Yin-Chao Hwang, Theo J. Powell, Parallel/serial scan system for testing logic circuits ,(1985)
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