In situ plasma diagnostics study of a commercial high-power hollow cathode magnetron deposition tool

作者: Liang Meng , Ramasamy Raju , Randolph Flauta , Hyungjoo Shin , David N. Ruzic

DOI: 10.1116/1.3271132

关键词:

摘要: Using a newly designed and built plasma diagnostic system, the parameters were investigated on commercial 200mm high-power hollow cathode magnetron (HCM) physical vapor deposition tool using Ta target under argon plasma. A three dimensional (3D) scanning radio frequency (rf)-compensated Langmuir probe was constructed to measure spatial distribution of electron temperature (Te) density (ne) in substrate region HCM at various input powers (2–15kW) pressures (10–70mTorr). The Te range 1–3eV, scaling with decreasing power pressure. Meanwhile, ne 4×1010–1×1012cm−3 increasing As metal deposits during measurements, self-cleaning cup installed chamber clean tungsten tip. However, its effectiveness recovering measured hindered by layer deposited insulating prob...

参考文章(15)
SM Rossnagel, J Hopwood, Metal ion deposition from ionized mangetron sputtering discharge Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. ,vol. 12, pp. 449- 453 ,(1994) , 10.1116/1.587142
B. E. Cherrington, The use of electrostatic probes for plasma diagnostics—A review Plasma Chemistry and Plasma Processing. ,vol. 2, pp. 113- 140 ,(1982) , 10.1007/BF00633129
N St J Braithwaite, J P Booth, G Cunge, A novel electrostatic probe method for ion flux measurements Plasma Sources Science and Technology. ,vol. 5, pp. 677- 684 ,(1996) , 10.1088/0963-0252/5/4/009
Babu Narayanan, Chao Yong Li, Kangsoo Lee, Bo Yu, Jun J. Wu, Pang Dow Foo, Joseph Xie, IMP copper seed layer formation with TaN barrier for deep submicron Multilevel interconnect technology. Conference. ,vol. 3883, pp. 42- 45 ,(1999) , 10.1117/12.360585
D. B. Hayden, D. R. Juliano, K. M. Green, D. N. Ruzic, C. A. Weiss, K. A. Ashtiani, T. J. Licata, Characterization of magnetron-sputtered partially ionized aluminum deposition Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. ,vol. 16, pp. 624- 627 ,(1998) , 10.1116/1.581078
Gottfried Wehner, Gustav Medicus, Reliability of Probe Measurements in Hot Cathode Gas Diodes Journal of Applied Physics. ,vol. 23, pp. 1035- 1046 ,(1952) , 10.1063/1.1702342
Daniel R. Juliano, David N. Ruzic, Monica M. C. Allain, Douglas B. Hayden, Influences on ionization fraction in an inductively coupled ionized physical vapor deposition device plasma Journal of Applied Physics. ,vol. 91, pp. 605- 612 ,(2002) , 10.1063/1.1425447
Vivek Vyas, Mark J. Kushner, Scaling of hollow cathode magnetrons for ionized metal physical vapor deposition Journal of Vacuum Science and Technology. ,vol. 24, pp. 1955- 1969 ,(2006) , 10.1116/1.2335864
K. M. Green, D. B. Hayden, D. R. Juliano, D. N. Ruzic, Determination of flux ionization fraction using a quartz crystal microbalance and a gridded energy analyzer in an ionized magnetron sputtering system Review of Scientific Instruments. ,vol. 68, pp. 4555- 4560 ,(1997) , 10.1063/1.1148430