Crystallographic and ferroelectric properties subjected to two-dimensional stress in c-axis-oriented PbTiO3 thin films

摘要: Relationships among Curie point, spontaneous polarization, lattice parameters with consideration of strain and piezoelectric charge coefficient were calculated as functions two-dimensional stress in c-axis-oriented PbTiO3 thin films using a modified Devonshire form the elastic Gibbs free energy. A compressive approximately 500 MPa was predicted by finite-element method analysis PbTiO3/Pt/Ti/SiO2/Si structure. 90° C shift point estimated from stress, shifts other properties accompanied phase transition.