Acceleration factor determination for potential-induced degradation in crystalline silicon PV modules

作者: P. Hacke , R. Smith , K. Terwilliger , S. Glick , D. Jordan

DOI: 10.1109/IRPS.2013.6532009

关键词:

摘要: Potential-induced degradation in conventional p-type silicon-based photovoltaic solar cell modules is described as a failure mechanism involving positive ion migration, understood to be primarily Na+, drifting from the glass cells negative-voltage arrays. Acceleration factors for this are determined silicon by comparing module power during outdoors that accelerated testing at three temperatures and 85% relative humidity. A lognormal analysis applied lifetime test data considering 80% of initial power. Activation energy 0.73 eV rate chamber constant humidity, probability an arbitrary temperature predicted. Estimation in-situ environmental achieved using dark I-V measurements transformed superposition. By means, degrading can semi-continuously so statistical multiple undergoing potential-induced easily accurately obtained.

参考文章(10)
R. G. Ross, A. R. Hoffman, Environmental qualification testing of terrestrial solar cell modules photovoltaic specialists conference. pp. 835- 842 ,(1978)
Peter Hacke, Kent Terwilliger, Steven Glick, David Trudell, Nick Bosco, Steve Johnston, Sarah Kurtz, Test-to-Failure of crystalline silicon modules photovoltaic specialists conference. pp. 000244- 000250 ,(2010) , 10.1109/PVSC.2010.5614472
Martin Wolf, Hans Rauschenbach, SERIES RESISTANCE EFFECTS ON SOLAR CELL MEASUREMENTS Advanced Energy Conversion. ,vol. 3, pp. 455- 479 ,(1963) , 10.1016/0365-1789(63)90063-8
Peter Hacke, Kent Terwilliger, Ryan Smith, Stephen Glick, Joel Pankow, Michael Kempe, Sarah Kurtz Ian Bennett, Mario Kloos, System voltage potential-induced degradation mechanisms in PV modules and methods for test photovoltaic specialists conference. pp. 000814- 000820 ,(2011) , 10.1109/PVSC.2011.6186079
Stephan Hoffmann, Michael Koehl, Effect of humidity and temperature on the potential-induced degradation Progress in Photovoltaics. ,vol. 22, pp. 173- 179 ,(2014) , 10.1002/PIP.2238
S. Pingel, O. Frank, M. Winkler, S. Daryan, T. Geipel, H. Hoehne, J. Berghold, Potential Induced Degradation of solar cells and panels 2010 35th IEEE Photovoltaic Specialists Conference. pp. 002817- 002822 ,(2010) , 10.1109/PVSC.2010.5616823
T. J. McMahon, Accelerated testing and failure of thin‐film PV modules Progress in Photovoltaics. ,vol. 12, pp. 235- 248 ,(2004) , 10.1002/PIP.526
J. Bauer, V. Naumann, S. Großer, C. Hagendorf, M. Schütze, O. Breitenstein, On the mechanism of potential-induced degradation in crystalline silicon solar cells Physica Status Solidi-rapid Research Letters. ,vol. 6, pp. 331- 333 ,(2012) , 10.1002/PSSR.201206276
Peter Hacke, Ryan Smith, Kent Terwilliger, Stephen Glick, Dirk Jordan, Steve Johnston, Michael Kempe, Sarah Kurtz, Testing and Analysis for Lifetime Prediction of Crystalline Silicon PV Modules Undergoing Degradation by System Voltage Stress IEEE Journal of Photovoltaics. ,vol. 3, pp. 246- 253 ,(2013) , 10.1109/JPHOTOV.2012.2222351