作者: P. Hacke , R. Smith , K. Terwilliger , S. Glick , D. Jordan
DOI: 10.1109/IRPS.2013.6532009
关键词:
摘要: Potential-induced degradation in conventional p-type silicon-based photovoltaic solar cell modules is described as a failure mechanism involving positive ion migration, understood to be primarily Na+, drifting from the glass cells negative-voltage arrays. Acceleration factors for this are determined silicon by comparing module power during outdoors that accelerated testing at three temperatures and 85% relative humidity. A lognormal analysis applied lifetime test data considering 80% of initial power. Activation energy 0.73 eV rate chamber constant humidity, probability an arbitrary temperature predicted. Estimation in-situ environmental achieved using dark I-V measurements transformed superposition. By means, degrading can semi-continuously so statistical multiple undergoing potential-induced easily accurately obtained.