Structural characterization of surfaces and interfaces of materials by applying x-ray total external reflection phenomena
作者： Masatoshi Saito, , Shigeo Sato, , Yoshio Waseda,
DOI: 10.1515/HTMP.1998.17.1-2.117
关键词:
摘要: An in-house grazing incidence x-ray scattering (GIXS) apparatus has been newly developed for characterizing the surface structure at a microscopic level. Using this apparatus, diffraction profiles from oxidized SUS304 stainless steel were measured in vicinity of critical angle with GIXS geometry. The depth profile was discussed integrated intensities both phase and bulk. reflection (GXR) also built studying liquid surface, liquid/solid liquid/liquid interfaces. This system tested by measuring reflectivity free mercury water/mercury interface. In addition, new method proposed determining atomic number density near-surface element materials using anomalous dispersion effect. essential equations analyzing data given capability (AGXR) well-confirmed obtaining densities near elements some selected examples ZrO 2 -Y O 3 crystal passivated steel.
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