XPS/GIXS studies of thin oxide films formed on FeCr alloys

摘要: Abstract X-ray photoelectron spectroscopy (XPS) and grazing incidence scattering (GIXS) have been used for characterizing thin oxide films formed on Fe-10 ∼ 90mass%Cr alloys by heating at 873 K in air. The XPS depth profiles indicate that the film of Fe10mass%Cr alloy consists mainly an iron oxide, a chromium is predominant with more than 50mass%. In Fe30mass%Cr alloy, two layered structure; rich outer layer inner layer. thickness appears to be insensitive bulk concentration range between 30 90 mass% under present oxidation condition. GIXS results identify main crystallographic structure corundum (Fe2O3 or Cr2O3) type structure, although it includes preferential orientation depends concentration.