作者: D. Peterka , A. Enders , G. Haas , K. Kern
DOI: 10.1063/1.1568556
关键词:
摘要: A new system combining a Kerr microscope and magnetic force for the study of domains in ultrathin films under ultrahigh vacuum conditions is presented. Due to overlapping imaging range both techniques can be investigated over lateral from millimeter down fractions micrometer. Experiments done at variable temperatures, 80 K 600 K. First results are presented showing same domain three monolayer Fe film on Cu (100) imaged with techniques.