Scanning low-temperature element-specific magnetic microscopy
作者： A. Cady , D. Haskel , J. C. Lang , G. Srajer , P. Chupas
DOI: 10.1063/1.1921510
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摘要: We have developed a low-temperature element-specific magnetic microscopy instrument at beamline 4-ID-D of the Advanced Photon Source. The setup enables simultaneous chemical and characterization materials with ∼1μm2 resolution low temperature (>10K) under moderate applied field (<0.8T). demonstrate potential this apparatus by presenting results correlating local behavior in inhomogeneous layered manganites multiferroic systems.
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