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作者: Seung-Won Lee
DOI:
关键词:
摘要: Disclosed is an erasing method for a nonvolatile memory device that includes selected cells and erase-verifying the after increasing their threshold voltage by application of negative bulk bias voltage.
,2013, 引用: 8
,2009, 引用: 362
,2011, 引用: 482
,2014, 引用: 4
,2009, 引用: 31
,2016, 引用: 4
,2016, 引用: 1
,2019, 引用: 0
,2018, 引用: 0
,2020, 引用: 0