作者: E. Rühl , C. Heinzel , A. P. Hitchcock , H. Baumgärtel
DOI: 10.1063/1.464146
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摘要: Total electron and total partial ion yield spectra of Ar clusters (with average size up to 600±200) in the region 2p excitation have been measured using synchrotron radiation time‐of‐flight mass spectrometry. As cluster increases, x‐ray absorption spectrum changes systematically from that atomic solid Ar. The shape 2p3/2→4s is found be a sensitive monitor sizes present molecular beam clusters. Extended fine structure (EXAFS) detected larger There strong correlation between intensity components signal associated with Fourier filtered first shell EXAFS signal. A low amplitude, high frequency observed continuum heaviest which corresponds closely This develops more slowly than E...