Active probe card
作者： Daniel B. D'Souza
DOI:
关键词:
摘要: An active probe card having integral test circuitry directly attached to the card. The includes a circuit board wherein is mounted on board. In an alternate embodiment, also on-board signal selection device. applies signals through pins integrated input pads and samples responses at output pads. orientation of each pin, i.e., or output, field programmable. may use boundary scan testing methodology. card's implement methodology IEEE standard 1149.1 analog determine ac dc parametric characteristics circuit. include terminals which Automatic Test Equipment (ATE) can be attached.
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