Superconducting electronics testing
作者： P.A. Moskowitz , R.W. Guernsey , J.W. Stasiak , E.B. Flint
DOI: 10.1016/0011-2275(83)90124-8
关键词:
摘要: Abstract An I/O assembly has been designed and constructed to support the operation of superconducting circuitry. The system, previously described 9 for chip testing, adapted use with a Josephson technology system level experiment. cryoinsert assembly, non-magnetic parts, provides 80 high frequency lines between room temperature 4.2 K.
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