SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD FOR SAME

作者: Iwasaki Shinya

DOI:

关键词:

摘要: This semiconductor device includes: a substrate provided with drift layer of first conductivity type, body second type to the top surface side layer, and part layer; trench gate extending from so as run through reach layer. The is insulation film formed on inner wall trench, electrode disposed film. located at depth enabling contact substrate, (100) crystal substrate. Regarding width in short direction orthogonal long narrower than spanning lower end

参考文章(8)
Chin-Te Kuo, Hsien-Wen Liu, Yi-Nan Chen, Trench mos structure and method for making the same ,(2011)
Masanobu Tsuchitani, Keiko Kawamura, Noboru Matsuda, Koichi Takahashi, Trench MIS device and method for manufacturing trench MIS device ,(2005)
Jun Saito, Takeshi Nishiwaki, 剛 西脇, 順 斎藤, Insulated gate bipolar transistor (igbt), and method of manufacturing the same ,(2008)
Takahata Toshihiko, Sumi Sadayuki, Sanagawa Yoshiharu, Ueda Michihiko, Nakasuji Takeshi, Yoshioka Nobuhiro, SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME ,(2010)
Eisuke Suekawa, Naoki Yutani, Yoichiro Tarui, Masayuki Imaizumi, Shiro Hino, Naruhisa Miura, Silicon carbide semiconductor device and method of manufacturing the same ,(2011)