Structural studies of ITO thin films with the Rietveld method
作者： M. Quaas , C. Eggs , H. Wulff
DOI: 10.1016/S0040-6090(98)01064-5
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摘要: … +y bi with the scale factor S, the multiplicity M i , the polarization-Lorentz factor PL i , the structure … F i , the profile function Φ(Θ), the texture function p i and the background correction y bi . …
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