作者: Chin-Hsiang Lin
DOI:
关键词:
摘要: A process for creating a modified crown shaped storage node electrode, DRAM capacitor structure, featuring increased surface area resulting via the addition of silicon hill, to conventional has been developed. thin, narrow insulator shape, is formed, between two wider, thicker shapes. After deposition polysilicon layer, chemical mechanical polishing procedure used form removal from top shapes, while traversing not removed. The shape had previously formed during an anisotropic RIE procedure, using photoresist as etch mask, with being narrower and thinner than counterpart mask patterning