Study of the structural properties of ZnO thin films by x-ray photoelectron spectroscopy
作者： Li-Jian Meng , Carlos P. Moreira de Sá , M.P. dos Santos
DOI: 10.1016/0169-4332(94)90031-0
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摘要: … Therefore, XPS has been used widely to analyze the film composition … O/Zn ratio of the films has been calculated by using the O1 component; the resuits are listed in Table 1. The O/Zn …
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