Formation of trenches having different profiles

作者: Masakatsu Tsuchiaki

DOI:

关键词:

摘要: Trenches having different profiles are formed in a material, such as semiconductor substrate, by forming resist pattern windows with at least two widths. An etchant, Fluorine, is implanted into portions of the using an ion implantation technique. A tilt angle and azimuth beam chosen that Fluorine ions cannot pass through narrower but can wider to impinge on underlying substrate. The substrate then subjected anisotropic etching process. Accordingly, regions exposed between narrow-width etched produce trenches highly vertical profiles. wide-width windows, including etchant ions, preferentially tapered

参考文章(19)
Shigenobu Yamakoshi, Tatsuyuki Sanada, Osamu Wada, Hideki Machida, Teruo Sakurai, Shuichi Miura, Method for producing a monolithically integrated optoelectronic device ,(1987)
Carol I. H. Ashby, George W. Arnold, Paul J. Brannon, Controlled ion implant damage profile for etching ,(1988)
Satoru Taji, Norio Yoshida, Tetsuo Hikawa, Etching of a phosphosilicate glass film selectively implanted with boron ,(1985)
Gary N. Taylor, Thirumalai N. C. Venkatesan, Device lithography by selective ion implantation ,(1981)
Malcolm Thackray, Thomas J. Magee, Shelley A. Stewart, Richard R. Pettijohn, Method of controlled surface texturization of crystalline semiconductor material ,(1977)
Erik Preston Harris, Robert William Keyes, Method for fabricating ultra-narrow metallic lines ,(1977)
W Johnson, J North, R Wolfe, Differential etching of garnet materials ,(1972)