作者: W. Maly , C. Ouyang , S. Ghosh , S. Maturi
DOI: 10.1109/DFTVS.1996.571999
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摘要: This paper describes an extraction methodology capable of detecting "antenna" condition in VLSI designs. Proposed can handle large size designs using standard design rule checking and circuit procedures. Examples application the proposed method on industrial IC show that occurrence antenna effect may be uncontrolled by-product environment.