Self-aligned contact process using stacked spacers

作者: Shui-Chin Huang

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摘要: A self-aligned contact process is provided on a semiconductor substrate having at least two gate structures and plurality of lightly ion-doped regions the substrate. Each has layer cap formed layer. first sidewall spacer sidewalls structure, then heavy region exposed region. Next, dielectric to fill gap between adjacent spacers. Part part removed expose second Finally, positioned are so as form hole.

参考文章(2)
Joel S. Kollin, Richard S. Johnston, Michael Tidwell, Charles D. Melville, Scanned beam display with adjustable accommodation ,(1999)