作者: Hongxia Fang , Zhiyuan Wang , Xinli Gu , Krishnendu Chakrabarty
DOI: 10.1109/ETS.2011.23
关键词:
摘要: Despite recent advances in structural test methods, the diagnosis of root cause board-level failures for functional tests remains a major challenge. A promising approach to address this problem is carry out fault two phases -- suspect faulty components on board or modules within (together referred as blocks paper) are first identified and ranked, then fine-grained used target ranked order. We propose new method based dataflow analysis Dempster-Shafer theory ranking phase diagnosis. The proposed transforms information derived from one failure into multiple-stage by partitioning given multiple stages. measure "belief" assigned each block knowledge failing stage, subsequently aggregate beliefs Blocks with higher at top candidate list. Simulations an industry design network interface application show that can provide accurate most failures.