Electric-field-induced current-voltage characteristics in electronic conducting perovskite thin films
作者： Jennifer L. M. Rupp , Patrick Reinhard , Daniele Pergolesi , Thomas Ryll , Rene Tölke
DOI: 10.1063/1.3663529
关键词:
摘要: Mixed ionic-electronic conductors (MIECs) such as the (La,Sr)(Co,Fe)O3−d perovskite family are well described in their charge transport through high temperature applications, i.e., solid-oxide fuel cell electrodes (600–1000 °C). In this study, current-voltage (I-V) profiles of these well-known MIEC perovskites studied between room and 150 °C under bias ±15 V for potential applications resistance random access memories. The impact metal-oxide interface on I-V characteristics ranging from ohmic to non-linear hysteretic is discussed metals varying work functions redox potentials, changes metal electrode distances areas.
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