On the Mechanism of Anisotropic Etching of Silicon

作者: M. Elwenspoek

DOI: 10.1149/1.2220767

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摘要: A new model is proposed that explains the anisotropy of etch rate single crystalline silicon in certain etchants. It inspired from theories crystal growth. We assume (111)-face flat on an atomic scale. Then should be governed by a nucleation barrier one layer deep cavities. The origin formation too small cavity increases free energy system due to step-free energy. and undersaturation governs activation rate. Having largest energy, etches slowest. qualitatively why etching isotropic etchants anisotropic others.

参考文章(1)
John E. Vance, Growth and Perfection of Crystals. Journal of the American Chemical Society. ,vol. 81, pp. 3489- 3490 ,(1959) , 10.1021/JA01522A099