Chemically vapor deposited Si nanowires nucleated by self-assembled Ti islands on patterned and unpatterned Si substrates

作者: T.I Kamins , R Stanley Williams , T Hesjedal , J.S Harris

DOI: 10.1016/S1386-9477(02)00287-4

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摘要: Abstract When Ti is deposited on Si in the 600–700°C temperature range, lattice mismatch between Ti-containing deposit and substrate causes TiSi x nanoislands to form. The grow when annealed at temperatures above 800°C. (either unannealed or annealed) are exposed a Si-containing precursor gas, catalyzes decomposition of allowing one-dimensional nanowires grow. If oxide-patterned substrates used, islands form selectively preferentially positioned near pattern edges. subsequently grown are, therefore, with respect larger lithographically formed pattern. Exposing wires an ion beam after deposition promotes parallel alignment nanowires.

参考文章(12)
R. P. Southwell, E. G. Seebauer, A Predictive Kinetic Model for the Chemical Vapor Deposition of TiSi2 Journal of The Electrochemical Society. ,vol. 143, pp. 1726- 1736 ,(1996) , 10.1149/1.1836708
T. I. Kamins, R. Stanley Williams, D. P. Basile, T. Hesjedal, J. S. Harris, Ti-catalyzed Si nanowires by chemical vapor deposition: Microscopy and growth mechanisms Journal of Applied Physics. ,vol. 89, pp. 1008- 1016 ,(2001) , 10.1063/1.1335640
R. S. Wagner, W. C. Ellis, K. A. Jackson, S. M. Arnold, Study of the Filamentary Growth of Silicon Crystals from the Vapor Journal of Applied Physics. ,vol. 35, pp. 2993- 3000 ,(1964) , 10.1063/1.1713143
R. P. Southwell, E. G. Seebauer, Kinetics of TiSi2 Formation and Silicon Consumption during Chemical Vapor Deposition Journal of The Electrochemical Society. ,vol. 144, pp. 2122- 2137 ,(1997) , 10.1149/1.1837751
T. I. Kamins, R. Stanley Williams, Lithographic positioning of self-assembled Ge islands on Si(001) Applied Physics Letters. ,vol. 71, pp. 1201- 1203 ,(1997) , 10.1063/1.119625
R. S. Wagner, W. C. Ellis, VAPOR‐LIQUID‐SOLID MECHANISM OF SINGLE CRYSTAL GROWTH Applied Physics Letters. ,vol. 4, pp. 89- 90 ,(1964) , 10.1063/1.1753975
Woochul Yang, F.J Jedema, H Ade, R.J Nemanich, Correlation of morphology and electrical properties of nanoscale TiSi2 epitaxial islands on Si (001) Thin Solid Films. ,vol. 308-309, pp. 627- 633 ,(1997) , 10.1016/S0040-6090(97)00431-8
Hyeongtag Jeon, C. A. Sukow, J. W. Honeycutt, G. A. Rozgonyi, R. J. Nemanich, Morphology and phase stability of TiSi2on Si Journal of Applied Physics. ,vol. 71, pp. 4269- 4276 ,(1992) , 10.1063/1.350808
G.A.D. Briggs, D.P. Basile, G. Medeiros-Ribeiro, T.I. Kamins, D.A.A. Ohlberg, R. Stanley Williams, The incommensurate nature of epitaxial titanium disilicide islands on Si(001) Surface Science. ,vol. 457, pp. 147- 156 ,(2000) , 10.1016/S0039-6028(00)00347-2