作者: J. Taniguchi , J. Yokoyama , M. Komuro , H. Hiroshima , I. Miyamoto
DOI: 10.1016/S0167-9317(00)00346-4
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摘要: We fabricated a single crystal diamond field emitter tip using focused ion beam assisted etching and investigated characteristics of electron emission from diamond. Electron is emission. FIB very useful to reduce site.