High speed bare chip test socket
作者： Dimitry G. Grabbe , Daniel R. Ringler , Iosif Korsunsky
DOI:
关键词:
摘要: An electrical socket (10) for interconnecting circuits on an integrated circuit chip to a substrate is disclosed. The includes base section (12), upper (16) and metallized plastic membrane (14) having traces (72) thereon. Contact pins (52) in the electrically connect inner ends (82) of outer (84) engage substrate.
lens.org 参考文章(12)
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