Quantitative phase imaging of nanoscale electrostatic and magnetic fields using off-axis electron holography
作者： Martha R. McCartney , Nipun Agarwal , Suk Chung , David A. Cullen , Myung-Geun Han
DOI: 10.1016/J.ULTRAMIC.2010.01.001
关键词:
摘要: Abstract Off-axis electron holography in the transmission microscope is a powerful interferometric technique that enables electrostatic and magnetic fields to be imaged quantified with spatial resolution often approaching nanometer scale. Here, we demonstrate capabilities of for phase quantification at nanoscale by briefly reviewing some our recent studies nanostructured materials. Examples are described include determination potential profiles associated doped Si- GaAs-based semiconductor devices, measurement hole accumulation Ge quantum dots, mapping polarization III-nitride heterostructures, observation remanent states reversal mechanisms lithographically patterned nanorings. Some issues sample preparation heterostructures also discussed.
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