In-situ TEM biasing experiments to study thickness-dependent ferroelectric domain switching of Pb(Zr,Ti)O 3 films
作者： Gayoung Shin , Ho-Nyung Lee , Jiseong Im , Gil-Ho Gu , Sang Ho Oh
DOI: 10.1109/NMDC.2011.6155296
关键词:
摘要: We devised a novel in-situ TEM characterization technique to study the size effects in ferroelectric polarization emerging at nanometer scales. For this purpose, an holder fitted column was used, through which voltage can be applied Pb(Zr,Ti)O 3 thin film. In-situ observation of nucleation and growth behaviors domains will presented.
sci-hub.se 参考文章(5)
D. D. Fong, Ferroelectricity in Ultrathin Perovskite Films Science. ,vol. 304, pp. 1650- 1653 ,(2004) , 10.1126/SCIENCE.1098252
Martha R. McCartney, Nipun Agarwal, Suk Chung, David A. Cullen, Myung-Geun Han, Kai He, Luying Li, Hua Wang, Lin Zhou, David J. Smith, Quantitative phase imaging of nanoscale electrostatic and magnetic fields using off-axis electron holography Ultramicroscopy. ,vol. 110, pp. 375- 382 ,(2010) , 10.1016/J.ULTRAMIC.2010.01.001
I. B. Misirlioglu, A. L. Vasiliev, S. P. Alpay, M. Aindow, R. Ramesh, Defect microstructures in epitaxial PbZr0.2Ti0.8O3 films grown on (001) SrTiO3 by pulsed laser deposition Journal of Materials Science. ,vol. 41, pp. 697- 707 ,(2006) , 10.1007/S10853-006-6488-9
H. Han, K. Lee, W. Lee, M. Alexe, D. Hesse, S. Baik, Fabrication of epitaxial nanostructured ferroelectrics and investigation of their domain structures Journal of Materials Science. ,vol. 44, pp. 5167- 5181 ,(2009) , 10.1007/S10853-009-3528-2