Domain configuration and dielectric properties of Ba0.6Sr0.4TiO3 thin films
作者： Chunlin Fu , Chuanren Yang , Hongwei Chen , Liye Hu , Linshan Dai
DOI: 10.1016/J.APSUSC.2005.01.069
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摘要: Abstract The microstructure and electrical properties of Ba 0.6 Sr 0.4 TiO 3 thin films have been investigated. Nanometer-sized domains, ranging from 8 to about 30 nm, were observed by piezoresponse force microscopy (PFM). critical size, below which only single domains exist, is found be 31 nm. film exhibits ferroelectric behavior characterized polarization hysteresis loop capacitance–voltage curve.
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