Development or removal of block copolymer or PMMA-b-S-based resist using polar supercritical solvent

作者: Shahab Siddiqui , Dmitriy Shneyder , Matthew E. Colburn

DOI:

关键词:

摘要: Methods of developing or removing a select region block copolymer films using polar supercritical solvent to dissolve portion are disclosed. In one embodiment, the includes chlorodifluoromethane, which may be exposed film carbon dioxide (CO2) as carrier chlorodiflouromethane itself in form. The invention also method forming nano-structure including exposing polymeric develop at least film. poly(methyl methacrylate-b-styrene) (PMMA-b-S) based resist solvent.

参考文章(52)
Wayne M. Moreau, David R. Medeiros, Kenneth J. McCullough, John P. Simons, Charles J. Taft, Supercritical fluid(SCF) silylation process ,(2000)
Lujia Bu, Kathleen M. O'Connell, Charles R. Szmanda, Kathleen B. Spear-Alfonso, Process of fractionating polymers ,(2004)
Vijayakumar Ramachandrarao, Subramanyam Iyer, Hyun-Mog Park, Bob Turkot, Supercritical carbon dioxide to reduce line edge roughness ,(2003)
Wayne Martin Moreau, Kenneth John McCullough, John Michael Cotte, Keith R. Pope, John P. Simons, Charles J. Taft, Apparatus for cleaning filters ,(1963)
John Michael Cotte, John P. Simons, Charles J. Taft, Matteo Flotta, Wayne Martin Moreau, Kenneth John McCullough, Fixtures for processing a workpiece in a supercritical fluid ,(2001)
Hideo c o Nippon Telegraph Tel. Corp. Namatsu, Pattern formation method and apparatus ,(1999)
Erik Schäffer, Thomas Thurn-Albrecht, Thomas P. Russell, Ullrich Steiner, Electrically induced structure formation and pattern transfer Nature. ,vol. 403, pp. 874- 877 ,(2000) , 10.1038/35002540