作者: Lynette Keeney , Claudia Groh , Santosh Kulkarni , Saibal Roy , Martyn E. Pemble
DOI: 10.1063/1.4734983
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摘要: Aurivillius phase thin films of Bi5Ti3(FexMn1−x)O15 with x = 1 (Bi5Ti3FeO15) and 0.7 (Bi5Ti3Fe0.7Mn0.3O15) on SiO2-Si(100) Pt/Ti/SiO2-Si substrates were fabricated by chemical solution deposition. The method was optimized in order to suppress formation pyrochlore Bi2Ti2O7 improve crystallinity. structural properties the examined x-ray diffraction, scanning electron microscopy, atomic force microscopy. Optimum crystallinity suppression achieved addition 15 25 mol. % excess bismuth sols. Based this study, 17.5 used preparation Bi2Ti2O7-free Bi5Ti3FeO15 SrTiO3(100) NdGaO3(001) substrates, confirming using bismuth. Thirty percent Fe3+ ions substituted Mn3+ form Bi5Ti3Fe0.7Mn0.3O15 Pt/Ti/SiO2-Si, SiO2-Si(100), SrTiO3(100), substrates. B...