Development of a state-dependent dispatch rule using theory of constraints in near-real-world wafer fabrication

作者: Jonah C. Tyan , James C. Chen , Fu-Kwun Wang

DOI: 10.1080/09537280110070278

关键词:

摘要: Wafer fabrication industries encounter challenging tasks to justify their performance among conflicting measures when making dispatch policy decisions. A state-dependent rule is developed improve overall system performance, which consists of cycle time, work in process, throughput and due date performance. The theory constraints adopted as guiding principle derive the rule. Three state variables (machine utilization, machine queue length, contention factor) three rules (two boundary, shortest time next visit, fastest for visit) are considered construct Response surface methodology also applied this study. near-realworld fab model test new simulation results show that TOC-based dependent improves four simultaneously.

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