Role of mechanical stresses in gradual degradation of light-emitting diodes and injection lasers
作者： P G Eliseev , A V Khaidarov
DOI: 10.1070/QE1975V005N01ABEH010732
关键词:
摘要: An experimental study showed that uniaxial compression (about 3000 kgf/cm2) accelerated the gradual degradation of gallium arsenide diodes. This was interpreted with aid a dislocation model in which centers were attributed to originally present dislocations multiplied by climb and slip processes. It suggested activated nonradiative recombination electron-hole pairs.
harvard.edu
sci-hub.se 参考文章(2)
H. Kressel, N. E. Byer, H. Lockwood, F. Z. Hawrylo, H. Nelson, M. S. Abrahams, S. H. McFarlane, Evidence for the role of certain metallurgical flaws in accelerating electroluminescent diode degradation Metallurgical and Materials Transactions B. ,vol. 1, pp. 635- 638 ,(1970) , 10.1007/BF02811588
B.C. De Loach, B.W. Hakki, R.L. Hartman, L.A. D'Asaro, Degradation of CW GaAs double-heterojunction lasers at 300 K Proceedings of the IEEE. ,vol. 61, pp. 1042- 1044 ,(1973) , 10.1109/PROC.1973.9197