作者: H. Kressel , N. E. Byer , H. Lockwood , F. Z. Hawrylo , H. Nelson
DOI: 10.1007/BF02811588
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摘要: Metallurgical imperfections in the recombination region such as dislocations and Ga2Te3 precipitates are shown to greatly increase rate of degradation quantum efficiency electroluminescent diodes lasers. In addition, is depend on acceptor used form thep-n junction, with beryllium-doped junctions degrading much faster than equivalent zinc-doped devices.