Development of a high energy resolution electron energy-loss spectroscopy microscope.
作者： TERAUCHI , TANAKA , TSUNO , ISHIDA
DOI: 10.1046/J.1365-2818.1999.00450.X
关键词:
摘要: We have developed a high energy resolution electron energy-loss spectroscopy (EELS) microscope, which can take spectra from specified small specimen areas and reciprocal space to investigate detailed electronic structures. The EELS microscope is equipped with retarding Wien filters as the monochromator analyser. are designed achieve stigmatic focus. resolutions 12 meV 25 meV for cases without specimen, respectively. Spatial momentum 30–110 nm in diameter 1.1 nm−1 angular diameter, presented show performance of this instrument.
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