Rietveld analysis of intensity data taken on the TOF neutron powder diffractometer VEGA

作者: T. Ohta , F. Izumi , K. Oikawa , T. Kamiyama

DOI: 10.1016/S0921-4526(97)00032-X

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摘要: Abstract A Rietveld-refinement program, RIETAN-96T, has been developed for a time-of-flight neutron powder diffractometer, VEGA, installed at the KENS. profile function optimized VEGA and an original feature called partial relaxation were implemented in giving excellent fits between observed calculated patterns.

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