作者: J.A. Leavitt , P. Stoss , D.B. Cooper , J.L. Seerveld , L.C. McIntyre
DOI: 10.1016/0168-583X(86)90307-1
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摘要: Abstract Cross sections for 170° backscattering of 4He ions incident on oxygen, aluminum and argon target atoms at energies in the range 1.8 to 5.0 MeV have been measured using beams from a 6 MV Van de Graaff. The targets were thin (850, 1950 A) films Ar-sputtered Al2O3 (on C substrates) which incorporated up 6% Ar. particular energy determined by comparing apparent thicknesses (in atoms/cm2) O, Al Ar film with those near 2 (where cross assumed be Rutherford). maxium intervals 50 keV, uncertainties ± 4%. section HeAr is nearly Rutherford over entire range, that HeAl shows small deviations above 4.2 MeV, while HeO strongly non-Rutherford 2.4 MeV. Results are presented graphical tabular form.