作者: S. Li , E. T. Kang , Z. H. Ma , K. L. Tan
DOI: 10.1002/(SICI)1096-9918(200002)29:2<95::AID-SIA699>3.0.CO;2-G
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摘要: … XPS preparation chamber, which was connected to the XPS … shifting the sample into the XPS analysis chamber for surface … The XPS measurements were made on a VG Escalab Mk II …