Electron microscopy study (HREM) of defects created in BaFe12O19 by krypton-ion-bombardment
作者： M. Hervieu , D. Groult , B. Raveau
DOI: 10.1080/00337578608208721
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摘要: Abstract Monocrystalline and polycrystalline samples of BaFe12O19 have been irradiated by 35 MeV/A krypton-ions to doses close 1018 ions.mminus;2 investigated high resolution electron microscopy (HREM). The study has devoted the induced structural changes in low energy range ions: 0 ≤ E <0.9 GeV. Besides amorphous transformation target heavily zone, some fragments were found exhibit three main types superstructures identified as a√3 × a√3, a, 2a 2a. They explained on basis local atomic orderings probably due difference strain between crystalline parts sample.
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