Threshold electronic energy loss for the creation of latent tracks in Y3Fe5O12 and BaFe12O19 oxides irradiated by high energy heavy ions
作者： F. Studer , D. Groult , N. Nguyen , M. Toulemonde
DOI: 10.1016/S0168-583X(87)80171-4
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摘要: The irradiation effects induced by highly energetic heavy ions (> 1 GeV) in two ferrimagnetic oxides Y 5 Fe O 12 and BaFe 19 have been investigated means of vibrating sample magnetometry Mossbauer spectroscopy. In the case 3.3 GeV-xenon ions, observation latent tracks high resolution electron microscopy suggests that a damage mechanism based on electronic stopping power is largely predominant contrary to 1.8 GeV-argon which show localized defects associated with cascades atomic collisions. As consequence, threshold energy loss for formation continuous has considered confirmed 2.8 3.7 GeV-krypton ion irradiations. Threshold values equal 8.5 MeV/μm thus determined 3 respectively showing structural effect target track formation.
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