Steady-state and transient behavior in dynamic atomic force microscopy

摘要: We discuss the influence of external forces on motion tip in dynamic atomic force microscopy (AFM). First, a compact solution for steady-state problem is derived employing Fourier approach. Founding this solution, we present an analytical framework to describe transient behavior after perturbations tip-sample and excitation signal. The static solutions are then combined obtain baseband response tip, i.e., deflection signal demodulated with respect excitation. generalizes amplitude phase use it find explicit formulas describing modulation following tip. Finally, apply our results accurate model controller phase-locked loop (PLL) driving cantilever frequency modulated AFM setup. A special emphasis put discussing environments high damping, such as ambient or liquid.