作者: Tao Wang , Jidong Long , Shiwei Wang , Zhen Yang , Jie Li
DOI: 10.1038/S41598-017-13780-8
关键词:
摘要: Scandium deuteride (ScDx) thin films, as an alternative target for deuterium-deuterium (D-D) reaction, are a very important candidate detection and diagnostic applications. Albeit with their superior thermal stability, the ignorance of stability ScDx under irradiation deuterium ion beam hinders realization full potential. In this report, we characterize films scanning electron microscopy (SEM) X-ray diffraction (XRD), Rutherford backscattering spectroscopy (RBS) elastic recoil analysis (ERDA). We found increased implantation ions, accumulation diffusion enhanced. Surprisingly, concentration restored to value before even at room temperature, revealing self-healing process which is great importance long-term operation neutron generator.