作者: Jeffrey J. Donatelli , Peter H. Zwart , James A. Sethian
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摘要: Fluctuation X-ray scattering (FXS) is an extension of small- and wide-angle in which the snapshots are taken below rotational diffusion times. This technique, performed using a free electron laser or ultrabright synchrotron source, provides significantly more experimental information compared with traditional solution methods. We develop multitiered iterative phasing algorithm to determine underlying structure object from FXS data.