作者: Meng Ding , Dongxu Zhao , Bin Yao , Zhipeng Li , Xijin Xu
DOI: 10.1039/C4RA11163J
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摘要: High quality ZnO microwires have been fabricated by chemical vapor deposition method. Ultraviolet photodetector based on heterojunction of n-ZnO (individual microwire)/p-GaN film was fabricated. The current–voltage characteristic the investigated, which showed that had rectifying behavior with rectification ratio (Iforward/Ireverse) about 6.3 × 102 at 4 V. photoresponse spectrum displayed a sharp cut-off wavelength 380 nm, and photoresponsivity as high 0.45 A W−1 0 V 1.3 2.5 reverse bias. ultraviolet-visible rejection (R370 nm/R450 nm) is three orders magnitude under zero