Development of a Measurement Method for the Thermal Conductivity of a Thick Film Prepared by a Screen-Printing Technique

摘要: We propose a method that allows us to evaluate the thermal conductivity of conductive material has thickness on order microns. The key feature proposed is use complete thermoelectric device with electrodes and substrate, while conventional methods measure temperature gradient materials directly without electrodes. measured ZnSb film annealed at 380°C in N2 ambient for 16 min 26 1.2 W/m K 1.4 K. measurement shows prepared by screen-printing technique lower than bulk (2.2 2.4 K) because generates high porosity film. porous films compared supports reliability method.